Philosophy, Politics and Economics

Fingerprint Dive into the research topics where Philosophy, Politics and Economics is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.

loyalty Social Sciences
corruption Social Sciences
penalty Social Sciences
Group Social Sciences
candidacy Social Sciences
scandal Social Sciences
laboratory experiment Social Sciences
evidence Social Sciences

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Profiles

Photo of Lieven Decock
19952019
Photo of Sanne Groothuis

Sanne Groothuis

Person: Academic

20182018
No photo of Akshath Jitendranath

Akshath Jitendranath

Person: Academic

No photo of Stefano Merlo

Stefano Merlo

Person: Academic

Research Output 2018 2018

In-Group Loyalty and the Punishment of Corruption

Solaz, H., De Vries, C. E. & de Geus, R. A., 19 Sep 2018, In : Comparative Political Studies. p. 1-31 31 p.

Research output: Contribution to JournalArticleAcademicpeer-review

loyalty
corruption
penalty
Group
candidacy

The construction of race, religion and toleration in counter-radicalisation policies

Groothuis, A. L., 22 Oct 2018.

Research output: Contribution to ConferencePosterAcademic

Activities 2018 2019

FWO (Research Foundation Flanders) (External organisation)

Lieven Decock (Member)
1 Jul 2019 → …

Activity: MembershipAcademic

OZSW Conference 2019

Marina Uzunova (Participant)
15 Nov 201916 Nov 2019

Activity: Participating in or organising an eventConferenceAcademic

Dutch Network Economics Day

Marina Uzunova (Participant)
17 Oct 2019

Activity: Participating in or organising an eventWorkshopAcademic

The Metrical Structure of Colour Experience

Lieven Decock (Speaker)
9 Jul 2019

Activity: Lecture / PresentationAcademic

Frege's Theorem and Mathematical Cognition

Lieven Decock (Speaker)
5 Jun 2019

Activity: Lecture / PresentationAcademic

Prizes

Press / Media

Nederland weert zich juist goed in de EU

Diederik Stadig

5/09/18

1 media contribution

Press/Media: Expert Comment