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Personal information

Peter Kraus is the group leader of the "High-harmonic generation and EUV science" team at ARCNL, and associate professor of physics at the Vrije Universiteit Amsterdam. Prior to joining ARCNL/VU in 2018 as group leader/assistant professor, Peter Kraus worked at the University of California, Berkeley (USA) on the development of new experimental techniques for investigating attosecond phenomena in solid-state materials. Peter obtained his PhD at ETH Zurich (Switzerland) in 2015. Here, he developed and advanced the techniques of high harmonic-spectroscopy for investigations of electronic and nuclear structure and dynamics of molecular systems. His PhD thesis was awarded the ETH medal for outstanding theses and the Justin Jankunkas award by the American Physical society for the best thesis in chemical physics.

Peter Kraus - ARCNL

Since starting at ARCNL/VU, Peter has obtained funding from the European Research Council (ERC Starting grant, 2022), NWO domain ENW in the form of a Veni (2018), a Vidi (2023) and open competition M-2 (2023), as well as funding from NWO domain TTW (Open Technology program, in 2020 and 2023).

Research

Our group focuses on the studies and development of coherent EUV/soft-X-ray sources based on the high-harmonic generation process with femtosecond/attosecond time and nanometer spatial resolution for spectroscopy, imaging, and metrology applications. The group is also actively exploring the potential of deactivation of high-harmonics for super-resolution microscopy.

Peter Kraus | Quantum Metrology & Laser Applications | ARCNL | Department of Physics and Astronomy

Ancillary activities

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Keywords

  • QC Physics
  • Metrology
  • Extreme ultraviolet (EUV) light
  • highly nonlinear light sources
  • high-harmonic generation
  • ultrafast spectroscopy
  • nanoscale metrology
  • nanolithography
  • attosecond phenomena in solid-state materials
  • high harmonic spectroscopy
  • electronic and nuclear structure and dynamics of molecular systems
  • EUV light sources
  • soft-X-ray sources
  • Deactivation of high-harmonics
  • super-resolution microscopy

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