A Note on Exponential Decay in the Random Field Ising Model

Federico Camia, Jianping Jiang*, Charles M. Newman

*Corresponding author for this work

Research output: Contribution to JournalArticleAcademicpeer-review

Fingerprint

Dive into the research topics of 'A Note on Exponential Decay in the Random Field Ising Model'. Together they form a unique fingerprint.

Mathematics