A note on exponential dispersion models which are invariant under length-biased sampling

S.K. Bar-Lev; F.A. van der Duyn Schouten

doi:10.1016/j.spl.2004.10.015

A note on exponential dispersion models which are invariant under length-biased sampling

S.K. Bar-Lev, F.A. van der Duyn Schouten

Research output: Contribution to Journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	275-284
Journal	Statistics and Probability Letters
Volume	70
Issue number	4
DOIs	https://doi.org/10.1016/j.spl.2004.10.015
Publication status	Published - 2004
Externally published	Yes

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DP 2003-84

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10.1016/j.spl.2004.10.015

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@article{3035814a63804149ab122fef7655a009,

title = "A note on exponential dispersion models which are invariant under length-biased sampling",

author = "S.K. Bar-Lev and \{van der Duyn Schouten\}, F.A.",

note = "DP 2003-84",

year = "2004",

doi = "10.1016/j.spl.2004.10.015",

language = "English",

volume = "70",

pages = "275--284",

journal = "Statistics and Probability Letters",

issn = "0167-7152",

publisher = "Elsevier B.V.",

number = "4",

}

TY - JOUR

T1 - A note on exponential dispersion models which are invariant under length-biased sampling

AU - Bar-Lev, S.K.

AU - van der Duyn Schouten, F.A.

N1 - DP 2003-84

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/22944442570

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U2 - 10.1016/j.spl.2004.10.015

DO - 10.1016/j.spl.2004.10.015

M3 - Article

SN - 0167-7152

VL - 70

SP - 275

EP - 284

JO - Statistics and Probability Letters

JF - Statistics and Probability Letters

IS - 4

ER -

A note on exponential dispersion models which are invariant under length-biased sampling

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