A study of the robustness of Pseudo Random Binary Array based surface characterization.

H.J.W. Spoelder, F Vos, E.M. Petriu, F.C.A. Groen

Research output: Contribution to Journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	830-835
Journal	Conference Proceedings - IEEE Instrumentation/Measurement Technology Conference
Volume	2
Publication status	Published - 1997

Proceedings title: IMTC Proceedings 1997
Publisher: IEEE
Place of publication: Piscataway NJ

Cite this

@article{78a15dcdbe414dee99d9fe22753d47b1,

title = "A study of the robustness of Pseudo Random Binary Array based surface characterization.",

author = "H.J.W. Spoelder and F Vos and E.M. Petriu and F.C.A. Groen",

note = "Proceedings title: IMTC Proceedings 1997 Publisher: IEEE Place of publication: Piscataway NJ",

year = "1997",

language = "English",

volume = "2",

pages = "830--835",

journal = "Conference Proceedings - IEEE Instrumentation/Measurement Technology Conference",

issn = "1091-5281",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - A study of the robustness of Pseudo Random Binary Array based surface characterization.

AU - Spoelder, H.J.W.

AU - Vos, F

AU - Petriu, E.M.

AU - Groen, F.C.A.

N1 - Proceedings title: IMTC Proceedings 1997 Publisher: IEEE Place of publication: Piscataway NJ

PY - 1997

Y1 - 1997

M3 - Article

VL - 2

SP - 830

EP - 835

JO - Conference Proceedings - IEEE Instrumentation/Measurement Technology Conference

JF - Conference Proceedings - IEEE Instrumentation/Measurement Technology Conference

SN - 1091-5281

ER -