A study of the robustness of Pseudo Random Binary Array based surface characterization.

H.J.W. Spoelder, F Vos, E.M. Petriu, F.C.A. Groen

    Research output: Contribution to JournalArticleAcademicpeer-review

    Original languageEnglish
    Pages (from-to)830-835
    JournalConference Proceedings - IEEE Instrumentation/Measurement Technology Conference
    Volume2
    Publication statusPublished - 1997

    Bibliographical note

    Proceedings title: IMTC Proceedings 1997
    Publisher: IEEE
    Place of publication: Piscataway NJ

    Cite this