Abstract
Particle identification in intermediate heavy-ion collisions, using a modern 4π detector which contains several active layers, relies on a parametrisation or numerical integration of the energy loss in thick layers of detector material for different ions. Here an analytical solution applicable over an energy range of a few MeV up to a 100A MeV and for ions up to at least Z = 8 is presented. Also, the consequences for time-of-flight measurements (TOF) in detectors behind several thick layers of detector material are discussed. The solution is applied to the data of the Huygens detector, which uses a TPC (dE/dx) and plastic scintillators for particle identification (E and TOF or dE/dx and TOF). © 1999 Elsevier Science B.V. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 368-375 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
| Volume | 438 |
| Issue number | 2-3 |
| DOIs | |
| Publication status | Published - 11 Dec 1999 |
| Externally published | Yes |
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