An x-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices

K. Temst, M.J. van Bael, Ch. van Haesendonck, Y. Bruynseraede, D.G. de Groot, N.J. Koeman, R.P. Griessen

Research output: Contribution to JournalArticleAcademicpeer-review

Abstract

The influence of thermal annealing on the surface and interface roughness of epitaxial Ag/Pd superlattices has been quantitatively characterized by high-angle X-ray diffraction and atomic force microscopy. Although Ag and Pd form a continuous series of solid solutions, it is shown that thermal annealing of the layered structure does not lead to complete interdiffusion, but rather to a clustering of the individual components. The bulk phase diagram of materials is clearly not the only factor determining the structural properties of thin layers in superlattices.
Original languageEnglish
Pages (from-to)174-179
JournalThin Solid Films
Volume342
DOIs
Publication statusPublished - 1999

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Superlattices
superlattices
x ray diffraction
roughness
Diffraction
Surface roughness
Annealing
X rays
annealing
Phase diagrams
Structural properties
Solid solutions
Atomic force microscopy
surface roughness
solid solutions
phase diagrams
atomic force microscopy
X ray diffraction
diffraction
x rays

Cite this

Temst, K., van Bael, M. J., van Haesendonck, C., Bruynseraede, Y., de Groot, D. G., Koeman, N. J., & Griessen, R. P. (1999). An x-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices. Thin Solid Films, 342, 174-179. https://doi.org/10.1016/S0040-6090(98)01498-9
Temst, K. ; van Bael, M.J. ; van Haesendonck, Ch. ; Bruynseraede, Y. ; de Groot, D.G. ; Koeman, N.J. ; Griessen, R.P. / An x-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices. In: Thin Solid Films. 1999 ; Vol. 342. pp. 174-179.
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abstract = "The influence of thermal annealing on the surface and interface roughness of epitaxial Ag/Pd superlattices has been quantitatively characterized by high-angle X-ray diffraction and atomic force microscopy. Although Ag and Pd form a continuous series of solid solutions, it is shown that thermal annealing of the layered structure does not lead to complete interdiffusion, but rather to a clustering of the individual components. The bulk phase diagram of materials is clearly not the only factor determining the structural properties of thin layers in superlattices.",
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Temst, K, van Bael, MJ, van Haesendonck, C, Bruynseraede, Y, de Groot, DG, Koeman, NJ & Griessen, RP 1999, 'An x-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices' Thin Solid Films, vol. 342, pp. 174-179. https://doi.org/10.1016/S0040-6090(98)01498-9

An x-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices. / Temst, K.; van Bael, M.J.; van Haesendonck, Ch.; Bruynseraede, Y.; de Groot, D.G.; Koeman, N.J.; Griessen, R.P.

In: Thin Solid Films, Vol. 342, 1999, p. 174-179.

Research output: Contribution to JournalArticleAcademicpeer-review

TY - JOUR

T1 - An x-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices

AU - Temst, K.

AU - van Bael, M.J.

AU - van Haesendonck, Ch.

AU - Bruynseraede, Y.

AU - de Groot, D.G.

AU - Koeman, N.J.

AU - Griessen, R.P.

PY - 1999

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N2 - The influence of thermal annealing on the surface and interface roughness of epitaxial Ag/Pd superlattices has been quantitatively characterized by high-angle X-ray diffraction and atomic force microscopy. Although Ag and Pd form a continuous series of solid solutions, it is shown that thermal annealing of the layered structure does not lead to complete interdiffusion, but rather to a clustering of the individual components. The bulk phase diagram of materials is clearly not the only factor determining the structural properties of thin layers in superlattices.

AB - The influence of thermal annealing on the surface and interface roughness of epitaxial Ag/Pd superlattices has been quantitatively characterized by high-angle X-ray diffraction and atomic force microscopy. Although Ag and Pd form a continuous series of solid solutions, it is shown that thermal annealing of the layered structure does not lead to complete interdiffusion, but rather to a clustering of the individual components. The bulk phase diagram of materials is clearly not the only factor determining the structural properties of thin layers in superlattices.

U2 - 10.1016/S0040-6090(98)01498-9

DO - 10.1016/S0040-6090(98)01498-9

M3 - Article

VL - 342

SP - 174

EP - 179

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -

Temst K, van Bael MJ, van Haesendonck C, Bruynseraede Y, de Groot DG, Koeman NJ et al. An x-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices. Thin Solid Films. 1999;342:174-179. https://doi.org/10.1016/S0040-6090(98)01498-9