Abstract
Reflection ptychography is a lensfree microscopy technique particularly promising in regions of the electromagnetic spectrum where imaging optics are inefficient or not available. This is the case in tabletop extreme ultraviolet microscopy and grazing incidence small angle x ray scattering experiments. Combining such experimental configurations with ptychography requires accurate knowledge of the relative tilt between the sample and the detector in non-coplanar scattering geometries. Here, we describe an algorithm for tilt estimation in reflection ptychography. The method is verified experimentally, enabling sample tilt determination within a fraction of a degree. Furthermore, the angle-estimation uncertainty and reconstruction quality are studied for both smooth and highly structured beams.
Original language | English |
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Pages (from-to) | 1949-1952 |
Number of pages | 4 |
Journal | Optics Letters |
Volume | 47 |
Issue number | 8 |
Early online date | 6 Apr 2022 |
DOIs | |
Publication status | Published - 15 Apr 2022 |
Bibliographical note
Funding Information:European Research Council (ERC-CoG 864016); Nederlandse Organisatie voor Wetenschappelijk Onderzoek (HTSM 13934).
Publisher Copyright:
© 2022 Optica Publishing Group.
Funding
European Research Council (ERC-CoG 864016); Nederlandse Organisatie voor Wetenschappelijk Onderzoek (HTSM 13934).
Funders | Funder number |
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Horizon 2020 Framework Programme | 864016 |
European Research Council | |
Nederlandse Organisatie voor Wetenschappelijk Onderzoek | HTSM 13934 |