aPIE: Angle calibration algorithm for reflection ptychography

Anne C.C. de Beurs, Lars Loetgering, Milan Herczog, Kjeld S.E. Eikema, Stefan Witte*

*Corresponding author for this work

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

Abstract

We demonstrate a tilt angle self-calibration technique for reflection mode ptychography. Experiments show accurate angle retrieval and improved image reconstruction, with spatially structured beams outperforming beams with smooth profiles.

Original languageEnglish
Title of host publicationComputational Optical Sensing and Imaging 2021 (COSI)
PublisherOSA - The Optical Society
ISBN (Print)9781943580897
Publication statusPublished - Jul 2021
EventComputational Optical Sensing and Imaging, COSI 2021 - Part of OSA Imaging and Applied Optics Congress 2021 - Virtual, Online, United States
Duration: 19 Jul 202123 Jul 2021

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceComputational Optical Sensing and Imaging, COSI 2021 - Part of OSA Imaging and Applied Optics Congress 2021
Country/TerritoryUnited States
CityVirtual, Online
Period19/07/2123/07/21

Bibliographical note

Publisher Copyright:
© OSA 2021, © 2021 The Author(s)

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