Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

Smrm Nezam, C. Joo, G. J. Tearney, J.F. de Boer

Research output: Contribution to JournalArticleAcademicpeer-review

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Original languageEnglish
Pages (from-to)17186-17195
Number of pages10
JournalOptics Express
Volume16
Issue number22
DOIs
Publication statusPublished - 2008

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Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

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