Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

Smrm Nezam; C. Joo; G. J. Tearney; J.F. de Boer

doi:10.1364/OE.16.017186

Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

Smrm Nezam, C. Joo, G. J. Tearney, J.F. de Boer

Physics of Living Systems

Research output: Contribution to Journal › Article › Academic › peer-review

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Original language	English
Pages (from-to)	17186-17195
Number of pages	10
Journal	Optics Express
Volume	16
Issue number	22
DOIs	https://doi.org/10.1364/OE.16.017186
Publication status	Published - 2008

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Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

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10.1364/OE.16.017186

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title = "Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy",

author = "Smrm Nezam and C. Joo and Tearney, {G. J.} and {de Boer}, J.F.",

note = "Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy",

year = "2008",

doi = "10.1364/OE.16.017186",

language = "English",

volume = "16",

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journal = "Optics Express",

issn = "1094-4087",

publisher = "The Optical Society",

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AU - Nezam, Smrm

AU - Joo, C.

AU - Tearney, G. J.

AU - de Boer, J.F.

N1 - Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

PY - 2008

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U2 - 10.1364/OE.16.017186

DO - 10.1364/OE.16.017186

M3 - Article

SN - 1094-4087

VL - 16

SP - 17186

EP - 17195

JO - Optics Express

JF - Optics Express

IS - 22

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