Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

F.A. van der Duyn Schouten, S.K. Bar-Lev

Research output: Book / ReportReportProfessional

Abstract

Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods. Keywords: testing; statistical methods; distribution; maximum likelihood; reliability;
Original languageEnglish
Place of PublicationTilburg
PublisherOperations research
Number of pages16
Publication statusPublished - 2003
Externally publishedYes

Publication series

NameCentER Discussion Paper
No.2003-83

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