Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution

Research output: Contribution to Journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	115-126
Journal	Journal of Applied Statistical Science
Volume	16
Issue number	1
Publication status	Published - 2007
Externally published	Yes

DP 2003-83

Access to Document

@article{b5d27d76ae824cdf9c4ffbe9c1c77f74,

title = "Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution",

author = "S.K. Bar-Lev and {van der Duyn Schouten}, F.A.",

note = "DP 2003-83",

year = "2007",

language = "English",

volume = "16",

pages = "115--126",

journal = "Journal of Applied Statistical Science",

issn = "1067-5817",

publisher = "Nova Science Publishers, Inc.",

number = "1",

}

TY - JOUR

T1 - Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution

AU - Bar-Lev, S.K.

AU - van der Duyn Schouten, F.A.

N1 - DP 2003-83

PY - 2007

Y1 - 2007

M3 - Article

SN - 1067-5817

VL - 16

SP - 115

EP - 126

JO - Journal of Applied Statistical Science

JF - Journal of Applied Statistical Science

IS - 1

ER -