Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution

S.K. Bar-Lev, F.A. van der Duyn Schouten

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)115-126
JournalJournal of Applied Statistical Science
Volume16
Issue number1
Publication statusPublished - 2007
Externally publishedYes

Bibliographical note

DP 2003-83

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