Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers.

K. Temst, M.J. van Bael, D.G. de Groot, N.J. Koeman, R.P. Griessen, B. Wuyts, Ch. van Haesendonck, Y. Bruynseraede

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)109-110
JournalJournal of Magnetism and Magnetic Materials
Publication statusPublished - 1996

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