Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers.

K. Temst; M.J. van Bael; D.G. de Groot; N.J. Koeman; R.P. Griessen; B. Wuyts; Ch. van Haesendonck; Y. Bruynseraede

doi:10.1016/0304-8853(95)00806-3

Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers.

K. Temst, M.J. van Bael, D.G. de Groot, N.J. Koeman, R.P. Griessen, B. Wuyts, Ch. van Haesendonck, Y. Bruynseraede

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Original language	English
Pages (from-to)	109-110
Journal	Journal of Magnetism and Magnetic Materials
Volume	156
DOIs	https://doi.org/10.1016/0304-8853(95)00806-3
Publication status	Published - 1996

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@article{a9e6ea430e4a4b65804c1ef43a8cc995,

title = "Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers.",

author = "K. Temst and {van Bael}, M.J. and {de Groot}, D.G. and N.J. Koeman and R.P. Griessen and B. Wuyts and {van Haesendonck}, Ch. and Y. Bruynseraede",

year = "1996",

doi = "10.1016/0304-8853(95)00806-3",

language = "English",

volume = "156",

pages = "109--110",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

}

TY - JOUR

T1 - Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers.

AU - Temst, K.

AU - van Bael, M.J.

AU - de Groot, D.G.

AU - Koeman, N.J.

AU - Griessen, R.P.

AU - Wuyts, B.

AU - van Haesendonck, Ch.

AU - Bruynseraede, Y.

PY - 1996

Y1 - 1996

U2 - 10.1016/0304-8853(95)00806-3

DO - 10.1016/0304-8853(95)00806-3

M3 - Article

VL - 156

SP - 109

EP - 110

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

ER -