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Bitmap-Based Security Monitoring for Deeply Embedded Systems

  • Anni Peng
  • , Dongliang Fang
  • , Le Guan
  • , Erik van der Kouwe
  • , Yin Li
  • , Wenwen Wang
  • , Limin Sun
  • , Yuqing Zhang*
  • *Corresponding author for this work

Research output: Contribution to Journal › Article › Academic › peer-review

Abstract

Deeply embedded systems powered by microcontrollers are becoming popular with the emergence of Internet-of-Things (IoT) technology. However, these devices primarily run C/C++ code and are susceptible to memory bugs, which can potentially lead to both control data attacks and non-control data attacks. Existing defense mechanisms (such as control-flow integrity (CFI), dataflow integrity (DFI) and write integrity testing (WIT), etc.) consume a massive amount of resources, making them less practical in real products. To make it lightweight, we design a bitmap-based allowlist mechanism to unify the storage of the runtime data for protecting both control data and non-control data. The memory requirements are constant and small, regardless of the number of deployed defense mechanisms. We store the allowlist in the TrustZone to ensure its integrity and confidentiality. Meanwhile, we perform an offline analysis to detect potential collisions and make corresponding adjustments when it happens. We have implemented our idea on an ARM Cortex-M-based development board. Our evaluation results show a substantial reduction in memory consumption when deploying the proposed CFI and DFI mechanisms, without compromising runtime performance. Specifically, our prototype enforces CFI and DFI at a cost of just 2.09% performance overhead and 32.56% memory overhead on average.

Original languageEnglish
Article number192
JournalACM Transactions on Software Engineering and Methodology
Volume33
Issue number7
Early online date27 Sept 2024
DOIs
Publication statusPublished - Sept 2024

Bibliographical note

Publisher Copyright:
© 2024 Copyright held by the owner/author(s). Publication rights licensed to ACM.

Funding

This work was supported in part by National Key Research and Development Program of China (Nos. 2023YFB3106400 and 2023QY1202), the National Natural Science Foundation (NSF) of China (U2336203 and U1836210), the Key Research and Development Science and Technology of Hainan Province (GHYF2022010), Beijing NSF (4242031), Beijing NSF (Grant No. L234033), the Netherlands Organization for Scientific Research (NWO) (Grant No. VI.Veni.202.212 VENI “Vulcan”), and U.S. NSF (Grant No. 2238264).

FundersFunder number
Nederlandse Organisatie voor Wetenschappelijk Onderzoek
National Natural Science Foundation of China
National Science FoundationU2336203, 2238264, U1836210
National Key Research and Development Program of China2023QY1202, 2023YFB3106400
Key Research and Development Science and Technology of Hainan ProvinceGHYF2022010
Natural Science Foundation of Beijing Municipality4242031, L234033

    Keywords

    • CFI
    • DFI
    • microcontroller
    • TEE

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