Broadband extreme ultraviolet interferometry and imaging

Matthijs Jansen, Anne de Beurs, Kevin Liu, Kjeld Eikema, Stefan Witte

Research output: Contribution to JournalArticleAcademicpeer-review


Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. Since we measure the interference with an EUV-sensitive CCD camera, this enables a wide range of spatially and spectrally resolved measurements at extreme ultraviolet wavelengths. We demonstrate the capabilities of this technique by performing wavelength-resolved high-resolution coherent diffractive imaging and by measuring the spatially resolved spectral absorption of a thin structured titanium film.
Original languageEnglish
Pages (from-to)02004
JournalEPJ Web of Conferences
Publication statusPublished - 2019


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