Chemical short-range order and lattice deformations in MgyTi1-yHx thin films probed by hydrogenography

R.F.A. Gremaud, A. Baldi, M. Gonzalez Silveira, B. Dam, R.P. Griessen

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Abstract

A multisite lattice gas approach is used to model pressure-optical- transmission isotherms (PTIs) recorded by hydrogenography on Mgy Ti1-y Hx sputtered thin films. The model reproduces the measured PTIs well and allows us to determine the chemical short-range order parameter s. The s values are in good agreement with those determined from extended x-ray absorption fine structure measurements. Additionally, the PTI multisite modeling yields a parameter L that accounts for the local lattice deformations with respect to the average Mgy Ti1-y lattice given by Vegard's law. It is thus possible to extract two essential characteristics of a metastable alloy from hydrogenographic data. © 2008 The American Physical Society.
Original languageEnglish
JournalPhysical Review B. Condensed Matter and Materials Physics
Volume77
Issue number14
DOIs
Publication statusPublished - Apr 2008

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Times Cited: 3

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