Abstract
A multisite lattice gas approach is used to model pressure-optical- transmission isotherms (PTIs) recorded by hydrogenography on Mgy Ti1-y Hx sputtered thin films. The model reproduces the measured PTIs well and allows us to determine the chemical short-range order parameter s. The s values are in good agreement with those determined from extended x-ray absorption fine structure measurements. Additionally, the PTI multisite modeling yields a parameter L that accounts for the local lattice deformations with respect to the average Mgy Ti1-y lattice given by Vegard's law. It is thus possible to extract two essential characteristics of a metastable alloy from hydrogenographic data. © 2008 The American Physical Society.
Original language | English |
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Journal | Physical Review B. Condensed Matter and Materials Physics |
Volume | 77 |
Issue number | 14 |
DOIs | |
Publication status | Published - Apr 2008 |