Abstract
Re-invented in the early 1990s, on both sides of the Atlantic, Monolithic Active Pixel Sensors (MAPS) in a CMOS technology are today the most sold solid-state imaging devices, overtaking the traditional technology of Charge-Coupled Devices (CCD). The slow uptake of CMOS MAPS started with low-end applications, for example web-cams, and is slowly pervading the high-end applications, for example in prosumer digital cameras. Higher specifications are required for scientific applications: very low noise, high speed, high dynamic range, large format and radiation hardness are some of these requirements.
This paper will present a brief overview of the CMOS Image Sensor technology and of the requirements for scientific applications. As an example, a sensor for X-ray imaging will be presented. This sensor was developed within a European FP6 Consortium, intelligent imaging sensors (I-ImaS).
This paper will present a brief overview of the CMOS Image Sensor technology and of the requirements for scientific applications. As an example, a sensor for X-ray imaging will be presented. This sensor was developed within a European FP6 Consortium, intelligent imaging sensors (I-ImaS).
| Original language | English |
|---|---|
| Pages (from-to) | 866-870 |
| Journal | Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment |
| Volume | 582 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2007 |
| Event | 15th International Workshop on Vertex Detectors, VERTEX06 - Duration: 1 Jan 2007 → … |
Bibliographical note
Proceedings title: VERTEX 2006: proceedings of the 15th International Workshop on Vertex Detectors: Perugia, Italy, September 25-29, 2006Publisher: Elsevier
Place of publication: [Amsterdam]
Editors: G. Ambrosi, G.M. Bilei, L. Fanò, D. Passeri, A. Santocchia, P. Zuccon