Detecting Cognitive Endophenotypes for Autism Using a General Population Twin Family Sample

R.A. Hoekstra, M. Bartels, G.F. Estourgie-van Burk, S. Baron-Cohen, D.I. Boomsma

Research output: Contribution to Conference › Poster › Other research output

Original language	English
Publication status	Published - 2008
Event	7th International Meeting for Autism Research - London Duration: 15 May 2008 → 17 May 2008

Conference	7th International Meeting for Autism Research
Period	15/05/08 → 17/05/08

Place of publication: London

Cohort Studies

@conference{c8780aafd1154b95b4e2630089b135b9,

title = "Detecting Cognitive Endophenotypes for Autism Using a General Population Twin Family Sample",

author = "R.A. Hoekstra and M. Bartels and \{Estourgie-van Burk\}, G.F. and S. Baron-Cohen and D.I. Boomsma",

note = "Place of publication: London; 7th International Meeting for Autism Research ; Conference date: 15-05-2008 Through 17-05-2008",

year = "2008",

language = "English",

}

TY - CONF

T1 - Detecting Cognitive Endophenotypes for Autism Using a General Population Twin Family Sample

AU - Hoekstra, R.A.

AU - Bartels, M.

AU - Estourgie-van Burk, G.F.

AU - Baron-Cohen, S.

AU - Boomsma, D.I.

N1 - Place of publication: London

PY - 2008

Y1 - 2008

M3 - Poster

T2 - 7th International Meeting for Autism Research

Y2 - 15 May 2008 through 17 May 2008

ER -