Effects of developer exhaustion on the sensitometric properties of four dental films

K. Syriopoulos, X.L. Velders, G.C.H. Sanderink, F.C. van Ginkel, P.F. van der Stelt

Research output: Contribution to Journal › Article › Academic › peer-review

Original language	Undefined/Unknown
Pages (from-to)	80-88
Journal	Dentomaxillofacial Radiology
Volume	28
DOIs	https://doi.org/10.1038/sj.dmfr.4600416
Publication status	Published - 1999

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title = "Effects of developer exhaustion on the sensitometric properties of four dental films",

author = "K. Syriopoulos and X.L. Velders and G.C.H. Sanderink and {van Ginkel}, F.C. and {van der Stelt}, P.F.",

year = "1999",

doi = "10.1038/sj.dmfr.4600416",

language = "Undefined/Unknown",

volume = "28",

pages = "80--88",

journal = "Dentomaxillofacial Radiology",

issn = "0250-832X",

publisher = "British Institute of Radiology",

}

TY - JOUR

T1 - Effects of developer exhaustion on the sensitometric properties of four dental films

AU - Syriopoulos, K.

AU - Velders, X.L.

AU - Sanderink, G.C.H.

AU - van Ginkel, F.C.

AU - van der Stelt, P.F.

PY - 1999

Y1 - 1999

U2 - 10.1038/sj.dmfr.4600416

DO - 10.1038/sj.dmfr.4600416

M3 - Article

SN - 0250-832X

VL - 28

SP - 80

EP - 88

JO - Dentomaxillofacial Radiology

JF - Dentomaxillofacial Radiology

ER -