Fast High-Resolution Screening Method for Reactive Surfaces by Combining Atomic Force Microscopy and Surface-Enhanced Raman Scattering

Camiel H. van Hoorn, Carlos Wessels, Freek Ariese, Arjan J. G. Mank

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A fast high-resolution screening method for reactive surfaces is presented. Atomic force microscopy (AFM) and surface-enhanced Raman spectroscopy (SERS) are combined in one method in order to be able to obtain both morphological and chemical information about processes at a surface. In order to accurately align the AFM and SERS images, an alignment pattern on the substrate material is exploited. Subsequent SERS scans with sub-micron resolution are recorded in 30 min per scan for an area of 100 × 100 µm2 and are accompanied by morphological information, supplied by a fast AFM, of the same area. Hence, a complete reactivity overview is obtained within several hours with only a monolayer of reactant. To demonstrate the working principle of this method, a SERS substrate containing the alignment pattern and silver nanoparticle aggregates as catalytic sites is prepared to study the photo-catalytic reduction of p-nitrothiophenol (p-NTP).
Original languageEnglish
Pages (from-to)1551-1559
Number of pages9
JournalApplied Spectroscopy
Issue number7
Publication statusPublished - Jul 2017


  • AFM
  • Raman imaging
  • SERS
  • Surface-enhanced Raman spectroscopy
  • atomic force miscroscopy
  • catalysis
  • p-NTP
  • p-nitrothiophenol

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