Fault-Based Test Case Generation for Component Connectros

B.K. Aichernig, F. Arbab, L. Astefanoaei, F.S. de Boer, S. Meng, J.J.M.M. Rutten

Research output: Chapter in Book / Report / Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 3rd IEEE Symposium on Theoretical Aspects of Software Engineering - TASE'09
Publisher	IEEE Computer Society Press
Pages	147-154
Publication status	Published - 2009

Persistent URL (handle)

@inproceedings{2042f778f0fc4114bdffcda7f23e8417,

title = "Fault-Based Test Case Generation for Component Connectros",

author = "B.K. Aichernig and F. Arbab and L. Astefanoaei and {de Boer}, F.S. and S. Meng and J.J.M.M. Rutten",

year = "2009",

language = "English",

pages = "147--154",

booktitle = "Proc. 3rd IEEE Symposium on Theoretical Aspects of Software Engineering - TASE'09",

publisher = "IEEE Computer Society Press",

}

TY - GEN

T1 - Fault-Based Test Case Generation for Component Connectros

AU - Aichernig, B.K.

AU - Arbab, F.

AU - Astefanoaei, L.

AU - de Boer, F.S.

AU - Meng, S.

AU - Rutten, J.J.M.M.

PY - 2009

Y1 - 2009

M3 - Conference contribution

SP - 147

EP - 154

BT - Proc. 3rd IEEE Symposium on Theoretical Aspects of Software Engineering - TASE'09

PB - IEEE Computer Society Press

ER -