Fault-Tolerance, Malleability and Migration for Divide-and-Conquer Applications on the Grid.

G. Wrzesinska, R.V. van Nieuwpoort, J. Maassen, H.E. Bal

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. of 19th International Parallel and Distributed Processing Symposium
Place of PublicationDenver, CO, USA
Publication statusPublished - 2005

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