Ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

D.C. Chavan, D Andres, D. Iannuzzi

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Abstract

In a recent paper [D.Chavan, Rev. Sci. Instrum. 81, 123702 (2010)] we have demonstrated that ferrule-top cantilevers, obtained by carving the end of a ferruled fiber, can be used for contact mode atomic force microscopy in ambient conditions. Here we show that those probes can provide tapping mode images at both room and cryogenic temperatures (12 K). © 2011 American Institute of Physics.
Original languageEnglish
Pages (from-to)046107
JournalReview of Scientific Instruments
Volume82
Issue number4
DOIs
Publication statusPublished - 2011

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