Ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

D.C. Chavan; D Andres; D. Iannuzzi

doi:10.1063/1.3579496

Ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

D.C. Chavan, D Andres, D. Iannuzzi

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Abstract

In a recent paper [D.Chavan, Rev. Sci. Instrum. 81, 123702 (2010)] we have demonstrated that ferrule-top cantilevers, obtained by carving the end of a ferruled fiber, can be used for contact mode atomic force microscopy in ambient conditions. Here we show that those probes can provide tapping mode images at both room and cryogenic temperatures (12 K). © 2011 American Institute of Physics.

Original language	English
Pages (from-to)	046107
Journal	Review of Scientific Instruments
Volume	82
Issue number	4
DOIs	https://doi.org/10.1063/1.3579496
Publication status	Published - 2011

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title = "Ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature",

abstract = "In a recent paper [D.Chavan, Rev. Sci. Instrum. 81, 123702 (2010)] we have demonstrated that ferrule-top cantilevers, obtained by carving the end of a ferruled fiber, can be used for contact mode atomic force microscopy in ambient conditions. Here we show that those probes can provide tapping mode images at both room and cryogenic temperatures (12 K). {\textcopyright} 2011 American Institute of Physics.",

author = "D.C. Chavan and D Andres and D. Iannuzzi",

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AB - In a recent paper [D.Chavan, Rev. Sci. Instrum. 81, 123702 (2010)] we have demonstrated that ferrule-top cantilevers, obtained by carving the end of a ferruled fiber, can be used for contact mode atomic force microscopy in ambient conditions. Here we show that those probes can provide tapping mode images at both room and cryogenic temperatures (12 K). © 2011 American Institute of Physics.

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Ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

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