Formal Analysis of Empirical Traces in Incident Management

M. Hoogendoorn, C.M. Jonker, S. Konur, P. van Maanen, V. Popova, O. Sharpanskykh, J. Treur, L. Xu, P. Yolum

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

LanguageEnglish
Title of host publicationApplications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence
EditorsA. Macintosh, R. Ellis, T. Allen
PublisherSpringer Verlag
Pages237-250
Publication statusPublished - 2004

Cite this

Hoogendoorn, M., Jonker, C. M., Konur, S., van Maanen, P., Popova, V., Sharpanskykh, O., ... Yolum, P. (2004). Formal Analysis of Empirical Traces in Incident Management. In A. Macintosh, R. Ellis, & T. Allen (Eds.), Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence (pp. 237-250). Springer Verlag.
Hoogendoorn, M. ; Jonker, C.M. ; Konur, S. ; van Maanen, P. ; Popova, V. ; Sharpanskykh, O. ; Treur, J. ; Xu, L. ; Yolum, P. / Formal Analysis of Empirical Traces in Incident Management. Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence. editor / A. Macintosh ; R. Ellis ; T. Allen. Springer Verlag, 2004. pp. 237-250
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title = "Formal Analysis of Empirical Traces in Incident Management",
author = "M. Hoogendoorn and C.M. Jonker and S. Konur and {van Maanen}, P. and V. Popova and O. Sharpanskykh and J. Treur and L. Xu and P. Yolum",
year = "2004",
language = "English",
pages = "237--250",
editor = "A. Macintosh and R. Ellis and T. Allen",
booktitle = "Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence",
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Hoogendoorn, M, Jonker, CM, Konur, S, van Maanen, P, Popova, V, Sharpanskykh, O, Treur, J, Xu, L & Yolum, P 2004, Formal Analysis of Empirical Traces in Incident Management. in A Macintosh, R Ellis & T Allen (eds), Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence. Springer Verlag, pp. 237-250.

Formal Analysis of Empirical Traces in Incident Management. / Hoogendoorn, M.; Jonker, C.M.; Konur, S.; van Maanen, P.; Popova, V.; Sharpanskykh, O.; Treur, J.; Xu, L.; Yolum, P.

Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence. ed. / A. Macintosh; R. Ellis; T. Allen. Springer Verlag, 2004. p. 237-250.

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Formal Analysis of Empirical Traces in Incident Management

AU - Hoogendoorn, M.

AU - Jonker, C.M.

AU - Konur, S.

AU - van Maanen, P.

AU - Popova, V.

AU - Sharpanskykh, O.

AU - Treur, J.

AU - Xu, L.

AU - Yolum, P.

PY - 2004

Y1 - 2004

M3 - Conference contribution

SP - 237

EP - 250

BT - Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence

A2 - Macintosh, A.

A2 - Ellis, R.

A2 - Allen, T.

PB - Springer Verlag

ER -

Hoogendoorn M, Jonker CM, Konur S, van Maanen P, Popova V, Sharpanskykh O et al. Formal Analysis of Empirical Traces in Incident Management. In Macintosh A, Ellis R, Allen T, editors, Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence. Springer Verlag. 2004. p. 237-250