Frequency comb metrology at PHz frequencies: Precision in the extreme ultraviolet

Ch Gohle, D. Z. Kandula, T. J. Pinkert, J. Morgenweg, I. Barmes, W. Ubachs, K. S E Eikema*

*Corresponding author for this work

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

Abstract

The capability of frequency-comb (FC) lasers to precisely measure optical frequencies is extended to the multiple-PHz domain. This frequency region, which covers the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), was previously not accessible to these devices. Frequency comb generation is shown for 51-85 nm by amplification and coherent up-conversion of a pair of pulses originating from a near-infrared femtosecond FC laser. Moreover, Ramsey-like signals with up to 61% contrast are observed when the XUV comb is scanned over transitions in argon, neon and helium, resulting in an 8-fold improved determination of the ground state ionization energy of helium.

Original languageEnglish
Title of host publication2011 30th URSI General Assembly and Scientific Symposium, URSIGASS 2011
DOIs
Publication statusPublished - 2011
Event2011 30th URSI General Assembly and Scientific Symposium, URSIGASS 2011 - Istanbul, Turkey
Duration: 13 Aug 201120 Aug 2011

Conference

Conference2011 30th URSI General Assembly and Scientific Symposium, URSIGASS 2011
CountryTurkey
CityIstanbul
Period13/08/1120/08/11

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    Gohle, C., Kandula, D. Z., Pinkert, T. J., Morgenweg, J., Barmes, I., Ubachs, W., & Eikema, K. S. E. (2011). Frequency comb metrology at PHz frequencies: Precision in the extreme ultraviolet. In 2011 30th URSI General Assembly and Scientific Symposium, URSIGASS 2011 [6050328] https://doi.org/10.1109/URSIGASS.2011.6050328