Original language | English |
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Title of host publication | Studies in Stemmatology II |
Editors | P. van Reenen, A. den Hollander, M. van Mulken |
Place of Publication | Amsterdam |
Publisher | John Benjamins |
Pages | 127-143 |
Publication status | Published - 2004 |
Genealogy by Chance! On the significance of accidental variation (parallelisms)
U.B. Schmid
Research output: Chapter in Book / Report / Conference proceeding › Conference contribution › Academic