Genetic analysis of longitudinally measured IQ, educational attainment and educational level in Dutch twin-sib samples

D.I. Boomsma, C.E.M. van Beijsterveldt, I.L.C. van Soelen, S. Franic, C.V. Dolan, D. Borsboom, M. Bartels

Research output: Contribution to JournalMeeting AbstractOther research output

Original languageEnglish
Pages (from-to)248-249
JournalTwin Research and Human Genetics
Volume13
Issue number3
Publication statusPublished - 2010

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