Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis.

J.A. van Kan, R.D. Vis

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)373
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume113
Issue number1-4
DOIs
Publication statusPublished - 1996

Cite this