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Grain size control of crystalline III-V semiconductors at ambient conditions using electrochemically mediated growth

  • Marco Valenti
  • , Yorick Bleiji
  • , Javier Blanco Portals
  • , Loreta A. Muscarella
  • , Mark Aarts
  • , Francesca Peiro
  • , Sonia Estrade
  • , Esther Alarcón-Lladó

Research output: Contribution to JournalArticleAcademicpeer-review

Abstract

The III-V semiconductor family has composition and size dependent optoelectronic properties ideal for a variety of applications in photonics and electronics. Due to the ever-increasing demand for nanophotonic and nanoelectronic devices, new crystal growth techniques have been proposed to tackle economical disadvantages of the more traditional methods. Electrochemical mediated III-V crystal growth has been demonstrated at room temperature and pressure. One of the advantages of this technique is the possibility of controlling the crystal growth with the applied potential. In this work we study the relationship between the applied potential and the resulting crystal structure of InAs. Raman analysis shows that the average crystal correlation length of the electrochemically grown InAs can be tuned by the deposition potential. In particular, we find that the average crystal correlation length decreases with applied potential, following the phonon confinement model. The decrease in the average crystal correlation length is explained here by an increase in the nanostructured roughness of the grown InAs. Such roughness is likely induced by co-contaminant gas evolution (e.g., H2 and AsH3). Our results clearly show that the crystal grain size of electrochemically-mediated growth of III-V semiconductors can be controlled with the potential, opening up the possibility to fine-tune optoelectronic properties at ambient conditions.
Original languageEnglish
Pages (from-to)2752-2759
JournalJournal of Materials Chemistry A
Volume8
Issue number5
DOIs
Publication statusPublished - 2020
Externally publishedYes

Funding

This work is part of the research program at the Netherlands Organisation for Scientic Research (NWO). Authors thank D. Ursem and the design and precision manufacturing departments at AMOLF for their support and the MAT2016-79455-P project from the Spanish Ministry of Science. The authors also thank Dr Sven Askes and Prof. Albert Polman for the valuable discussions, and Tom Veeken for his help with the Raman microscopy set-up.

Funders
Ministerio de Ciencia e Innovación

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