Growth, defect structure and critical currents in YBa2Cu3O7-¿ thin films.

J.M. Huijbregtse

Research output: PhD ThesisPhD-Thesis - Research and graduation internal

Original languageUndefined/Unknown
Awarding Institution
  • Vrije Universiteit Amsterdam
  • Griessen, R.P., Supervisor
  • Dam, B., Co-supervisor
Award date1 May 2001
Publication statusPublished - 2001

Bibliographical note

Naam instelling promotie: Vrije Universiteit, Amsterdam
Naam instelling onderzoek: Vrije Universiteit, Amsterdam

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