High Accuracy Absolute Long Distance Metrology using femtosecond lasers: Optical frequency combs and spectral interference techniques

R. Holzwarth*, K. S.E. Eikema, T. Steinmetz, T. W. Hänsch, V. Klein, P. Gill, G. Barwood, H. Margolis

*Corresponding author for this work

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

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