Original language | English |
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Pages (from-to) | 54-56 |
Journal | Physics Letters A |
Volume | 78 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1980 |
HIGH-RESOLUTION MEASUREMENTS OF THE HYPERFINE-STRUCTURE IN 10 LEVELS OF TM-I
K.A.H. van Leeuwen, E.R. Eliel, W. Hogervorst
Research output: Contribution to Journal › Article › Academic › peer-review