HIGH-RESOLUTION MEASUREMENTS OF THE HYPERFINE-STRUCTURE IN 10 LEVELS OF TM-I

K.A.H. van Leeuwen, E.R. Eliel, W. Hogervorst

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)54-56
JournalPhysics Letters A
Volume78
Issue number1
DOIs
Publication statusPublished - 1980

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