Hydrogenography of PdHx thin films: Influence of H-induced stress relaxation processes

R.F.A. Gremaud, M. Gonzalez Silveira, Y. Pivak, S.P.J. de Man, M.J. Slaman, H. Schreuders, B. Dam, R.P. Griessen

Research output: Contribution to JournalArticleAcademicpeer-review

Abstract

Hydrogenography is a new optical thin film combinatorial method that follows hydrogenation and determines its associated thermodynamic properties. Due to clamping to the substrate, stresses generated in thin films are larger than ill bulk. This Must be taken into account for a comparison between these two types of systems. In this article, we follow the microstructure. surface morphology and inplane stress changes of thin polycrystalline PdHx films upon several hydrogen ab/desorption cycles and correlate them to the evolution in shape and hysteresis of pressure-optical transmission isotherms (PTIs) recorded by hydrogenography. The in-plane stress in the first instance is relaxed inhomogeneously by buckling, and it more complete, homogeneous relaxation is only reached after the creation of it buckle-and-crack network that is the two-dimensional analogue of bulk decrepitated grains. This sequence of changes is clearly visible in the PTIs, demonstrating another useful facet of hydrogenography for characterizing metal-hydrogen systems. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved
Original languageEnglish
Pages (from-to)1209-1219
Number of pages11
JournalActa Materialia
Volume57
Issue number4
DOIs
Publication statusPublished - Feb 2009

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Hydrogenography of PdHx thin films: Influence of H-induced stress relaxation processes

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