Improved x-ray detection and particle identification with avalanche photodiodes

Marc Diepold*, Luis M.P. Fernandes, Jorge Machado, Pedro Amaro, Marwan Abdou-Ahmed, Fernando D. Amaro, Aldo Antognini, François Biraben, Tzu Ling Chen, Daniel S. Covita, Andreas J. Dax, Beatrice Franke, Sandrine Galtier, Andrea L. Gouvea, Johannes Götzfried, Thomas Graf, Theodor W. Hänsch, Malte Hildebrandt, Paul Indelicato, Lucile JulienKlaus Kirch, Andreas Knecht, Franz Kottmann, Julian J. Krauth, Yi Wei Liu, Cristina M.B. Monteiro, Françoise Mulhauser, Boris Naar, Tobias Nebel, François Nez, José Paulo Santos, Joaquim M.F. Dos Santos, Karsten Schuhmann, Csilla I. Szabo, David Taqqu, João F.C.A. Veloso, Andreas Voss, Birgit Weichelt, Randolf Pohl

*Corresponding author for this work

Research output: Contribution to JournalArticleAcademicpeer-review


Avalanche photodiodes are commonly used as detectors for low energy x-rays. In this work, we report on a fitting technique used to account for different detector responses resulting from photoabsorption in the various avalanche photodiode layers. The use of this technique results in an improvement of the energy resolution at 8.2 keV by up to a factor of 2 and corrects the timing information by up to 25 ns to account for space dependent electron drift time. In addition, this waveform analysis is used for particle identification, e.g., to distinguish between x-rays and MeV electrons in our experiment.

Original languageEnglish
Article number053102
JournalReview of Scientific Instruments
Issue number5
Publication statusPublished - 1 May 2015


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