In situ resistivity measurements and optical transmission and reflection spectroscopy of electrochemically loaded switchable YHx films

E.S. Kooij, A.T.M. van Gogh, R.P. Griessen

Research output: Contribution to JournalArticleAcademicpeer-review

Abstract

We describe an experimental method for in situ resistivity measurements during the electrochemical hydrogen loading of thin, switchable metal hydride films. Using an oxygen-free electrolyte we are able to measure the hydrogen concentration in the films quantitatively and to determine the pressure-composition isotherms and the hydrogen concentration dependence of the resistivity. Furthermore, the optical properties can be investigated by simultaneous transmission and reflection spectroscopy. The power of these in situ measurements is discussed on the basis of results obtained on YH
Original languageEnglish
Pages (from-to)2990-2994
JournalTransactions of the Electrochemical Society
Volume146
Issue number8
DOIs
Publication statusPublished - 1999

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