Incident photon-to-current efficiency measurements as a helpful tool to analyze luminescence loss mechanisms in organic light-emitting diodes

R. Huber, Holger Borchert, E. von Hauff, S. Heun, H. Buchholz, J. Parisi

Research output: Contribution to JournalArticleAcademicpeer-review

Abstract

Electrical aging can increase non-radiative recombination processes in organic light-emitting diodes (OLEDs) which leads to a reduction in device efficiency. We investigated aging-related changes of the opto-electronic properties of OLEDs by a combination of photoluminescence, electroluminescence (EL), and photoluminescence excitation spectroscopy as well as measurements of the incident photon-to-current efficiency (IPCE). The EL measurements revealed a pronounced decrease in radiative recombination after electrical aging, and it is demonstrated here that IPCE measurements can make a useful contribution to identify the materials and processes that are affected most by electrical aging.
Original languageEnglish
Article number043311
JournalApplied Physics Letters
Volume103
Issue number4
DOIs
Publication statusPublished - 22 Jul 2013

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