Ion beam analysis of oxidation and hydrogenation of switchable mirrors

M.C. Huisman; M.R. Jongerden; S.J. van der Molen; R.D. Vis

doi:10.1016/S0168-583X(01)00352-4

Ion beam analysis of oxidation and hydrogenation of switchable mirrors

M.C. Huisman, M.R. Jongerden, S.J. van der Molen, R.D. Vis

Research output: Contribution to Journal › Article › Academic › peer-review

Abstract

Thin films of Y, La or rare earth (RE) hydrides exhibit a metal insulator transition between their di- and trihydride phase. After H loading lateral diffusion samples of these materials contain an overview of all hydride phases present in the thin film phase diagram. In this paper the thin film YH

Original language	English
Pages (from-to)	389-393
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume	181
Issue number	1-4
DOIs	https://doi.org/10.1016/S0168-583X(01)00352-4
Publication status	Published - Jul 2001

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Available online 6 September 2001

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10.1016/S0168-583X(01)00352-4

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@article{c06d1164b6be4692b19d00215f9317f1,

title = "Ion beam analysis of oxidation and hydrogenation of switchable mirrors",

abstract = "Thin films of Y, La or rare earth (RE) hydrides exhibit a metal insulator transition between their di- and trihydride phase. After H loading lateral diffusion samples of these materials contain an overview of all hydride phases present in the thin film phase diagram. In this paper the thin film YH",

author = "M.C. Huisman and M.R. Jongerden and {van der Molen}, S.J. and R.D. Vis",

note = "Available online 6 September 2001",

year = "2001",

month = jul,

doi = "10.1016/S0168-583X(01)00352-4",

language = "English",

volume = "181",

pages = "389--393",

journal = "Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "1-4",

}

TY - JOUR

T1 - Ion beam analysis of oxidation and hydrogenation of switchable mirrors

AU - Huisman, M.C.

AU - Jongerden, M.R.

AU - van der Molen, S.J.

AU - Vis, R.D.

N1 - Available online 6 September 2001

PY - 2001/7

Y1 - 2001/7

N2 - Thin films of Y, La or rare earth (RE) hydrides exhibit a metal insulator transition between their di- and trihydride phase. After H loading lateral diffusion samples of these materials contain an overview of all hydride phases present in the thin film phase diagram. In this paper the thin film YH

AB - Thin films of Y, La or rare earth (RE) hydrides exhibit a metal insulator transition between their di- and trihydride phase. After H loading lateral diffusion samples of these materials contain an overview of all hydride phases present in the thin film phase diagram. In this paper the thin film YH

U2 - 10.1016/S0168-583X(01)00352-4

DO - 10.1016/S0168-583X(01)00352-4

M3 - Article

SN - 0168-583X

VL - 181

SP - 389

EP - 393

JO - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

IS - 1-4

ER -

Ion beam analysis of oxidation and hydrogenation of switchable mirrors

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