Isotope dilution concentration analyses of Lu, Hf, Zr, Ta and W, and Hf isotope compositions of NIST SRM-610 and SRM-612 glass wafers

O. Nebel, M.L.A. Morel, P.Z. Vroon

    Research output: Contribution to JournalArticleAcademicpeer-review

    Abstract

    Isotope dilution determinations of Lu, Hf, Zr, Ta and W are reported for nine test portions (five for W) of NIST SRM 610 and 612 glass wafers. Additionally, all test portions were analysed for their Hf isotope compositions. In general, high field strength elemental (HFSE) distributions in NIST SRM 610 and 612 were reproducible to ∼ ± 1%, except for Zr (± 5%) in NIST SRM 612, and absolute reported concentrations agreed with previously published values, but with higher precision. The slightly worse reproducibility of Zr in NIST SRM 612 compared to other HFSE is interpreted to result from analytical scatter, rather than sample inhomogeneity. The analyses demonstrated elemental homogeneity for both glass wafers for samples of 1-2 mg with respect to the precision of the method, i.e., ± 1% or better. Average Hf isotope compositions for both glass wafers agreed within uncertainty and the weighted average of all determinations yielded a mean
    Original languageEnglish
    Pages (from-to)487-499
    Number of pages12
    JournalGeostandards and Geoanalytical Research
    Volume33
    Issue number4
    DOIs
    Publication statusPublished - 2009

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