Mapping reliability in multicenter MRI: Voxel-based morphometry and cortical thickness

H.G. Schnack, N.E.M. Van Haren, R.M. Brouwer, G.C.M. Van Baal, M. Picchioni, M. Weisbrod, H. Sauer, T.D. Cannon, M. Huttunen, C. Lepage, D.L. Collins, A. Evans, R.M. Murray, R.S. Kahn, H.E. Hulshoff Pol