Measuring laser beam quality, wavefronts, and lens aberrations using ptychography

Mengqi Du, Lars Loetgering, Kjeld S.E. Eikema, Stefan Witte

Research output: Contribution to JournalArticleAcademicpeer-review

Abstract

We report on an approach for quantitative characterization of laser beam quality, wavefronts, and lens aberrations using ptychography with a near-infrared supercontinuum laser. Ptychography is shown to offer a powerful alternative for both beam propagation ratio M2 and wavefront measurements compared with existing techniques. In addition, ptychography is used to recover the transmission function of a microlens array for aberration analysis. The results demonstrate ptychography’s flexibility in wavefront metrology and optical shop testing.

Original languageEnglish
Pages (from-to)5022-5034
Number of pages13
JournalOptics Express
Volume28
Issue number4
DOIs
Publication statusPublished - 17 Feb 2020

Funding

Nederlandse Organisatie voor Wetenschappelijk Onderzoek (13934); European Research Council (637476).

FundersFunder number
Horizon 2020 Framework Programme637476
European Research Council
Nederlandse Organisatie voor Wetenschappelijk Onderzoek13934

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