Abstract
We report on an approach for quantitative characterization of laser beam quality, wavefronts, and lens aberrations using ptychography with a near-infrared supercontinuum laser. Ptychography is shown to offer a powerful alternative for both beam propagation ratio M2 and wavefront measurements compared with existing techniques. In addition, ptychography is used to recover the transmission function of a microlens array for aberration analysis. The results demonstrate ptychography’s flexibility in wavefront metrology and optical shop testing.
| Original language | English |
|---|---|
| Pages (from-to) | 5022-5034 |
| Number of pages | 13 |
| Journal | Optics Express |
| Volume | 28 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 17 Feb 2020 |
Funding
Nederlandse Organisatie voor Wetenschappelijk Onderzoek (13934); European Research Council (637476).
| Funders | Funder number |
|---|---|
| Horizon 2020 Framework Programme | 637476 |
| European Research Council | |
| Nederlandse Organisatie voor Wetenschappelijk Onderzoek | 13934 |