Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance

W C L Hopman, Kees O van der Werf, A J F Hollink, W Bogaerts, V Subramaniam, René M de Ridder

    Research output: Contribution to JournalArticleAcademicpeer-review

    Abstract

    We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si(3)N(4) or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.

    Original languageEnglish
    Pages (from-to)8745-52
    Number of pages8
    JournalOptics Express
    Volume14
    Issue number19
    DOIs
    Publication statusPublished - 18 Sep 2006

    Keywords

    • Journal Article

    Fingerprint

    Dive into the research topics of 'Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance'. Together they form a unique fingerprint.

    Cite this