Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance

W C L Hopman, Kees O van der Werf, A J F Hollink, W Bogaerts, V Subramaniam, René M de Ridder

    Research output: Contribution to JournalArticleAcademicpeer-review


    We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si(3)N(4) or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.

    Original languageEnglish
    Pages (from-to)8745-52
    Number of pages8
    JournalOptics Express
    Issue number19
    Publication statusPublished - 18 Sep 2006


    • Journal Article


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