Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

C.H. van Hoorn, D.C. Chavan, B Tiribilli, G Margheri, A.J.G. Mank, F. Ariese, D. Iannuzzi

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Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution. © 2014 Optical Society of America.
Original languageEnglish
Pages (from-to)4800-4803
JournalOptics Letters
Issue number16
Publication statusPublished - 2014

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© [2014 Optical Society of America.]. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.


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