Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

C.H. van Hoorn; D.C. Chavan; B Tiribilli; G Margheri; A.J.G. Mank; F. Ariese; D. Iannuzzi

doi:10.1364/OL.39.004800

Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

C.H. van Hoorn
, D.C. Chavan
, B Tiribilli
, G Margheri
, A.J.G. Mank
, F. Ariese
, D. Iannuzzi

Research output: Contribution to Journal › Article › Academic › peer-review

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Abstract

Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution. © 2014 Optical Society of America.

Original language	English
Pages (from-to)	4800-4803
Journal	Optics Letters
Volume	39
Issue number	16
DOIs	https://doi.org/10.1364/OL.39.004800
Publication status	Published - 2014

Bibliographical note

© [2014 Optical Society of America.]. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.

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title = "Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis",

abstract = "Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution. {\textcopyright} 2014 Optical Society of America.",

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doi = "10.1364/OL.39.004800",

language = "English",

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T1 - Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

AU - van Hoorn, C.H.

AU - Chavan, D.C.

AU - Tiribilli, B

AU - Margheri, G

AU - Mank, A.J.G.

AU - Ariese, F.

AU - Iannuzzi, D.

N1 - © [2014 Optical Society of America.]. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.

PY - 2014

Y1 - 2014

N2 - Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution. © 2014 Optical Society of America.

AB - Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution. © 2014 Optical Society of America.

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DO - 10.1364/OL.39.004800

M3 - Article

SN - 0146-9592

VL - 39

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EP - 4803

JO - Optics Letters

JF - Optics Letters

IS - 16

ER -

Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

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