Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces

Eline M. Hutter, Thomas Kirchartz, Bruno Ehrler, David Cahen, Elizabeth Von Hauff*

*Corresponding author for this work

Research output: Contribution to JournalReview articleAcademicpeer-review

Abstract

Perovskite photovoltaics has witnessed an unprecedented increase in power conversion efficiency over the last decade. The choice of transport layers, through which photo-generated electrons and holes are transported to electrodes, is a crucial factor for further improving both the device performance and stability. In this perspective, we critically examine the application of optical spectroscopy to characterize the quality of the transport layer-perovskite interface. We highlight the power of complementary studies that use both continuous wave and time-resolved photoluminescence to understand non-radiative losses and additional transient spectroscopies for characterizing the potential for loss-less carrier extraction at the solar cell interfaces. Based on this discussion, we make recommendations on how to extrapolate results from optical measurements to assess the quality of a transport layer and its impact on solar cell efficiency.

Original languageEnglish
Article number100501
Pages (from-to)1-14
Number of pages14
JournalApplied Physics Letters
Volume116
Issue number10
DOIs
Publication statusPublished - 9 Mar 2020

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