TY - GEN
T1 - Plan assessment for autonomous manufacturing as bayesian inference
AU - Maier, Paul
AU - Jain, Dominik
AU - Waldherr, Stefan
AU - Sachenbacher, Martin
PY - 2010/11/22
Y1 - 2010/11/22
N2 - Next-generation autonomous manufacturing plants create individualized products by automatically deriving manufacturing schedules from design specifications. However, because planning and scheduling are computationally hard, they must typically be done offline using a simplified system model, meaning that online observations and potential component faults cannot be considered. This leads to the problem of plan assessment: Given behavior models and current observations of the plant's (possibly faulty) behavior, what is the probability of a partially executed manufacturing plan succeeding? In this work, we propose 1) a statistical relational behavior model for a class of manufacturing scenarios and 2) a method to derive statistical bounds on plan success probabilities for each product from confidence intervals based on sampled system behaviors. Experimental results are presented for three hypothetical yet realistic manufacturing scenarios.
AB - Next-generation autonomous manufacturing plants create individualized products by automatically deriving manufacturing schedules from design specifications. However, because planning and scheduling are computationally hard, they must typically be done offline using a simplified system model, meaning that online observations and potential component faults cannot be considered. This leads to the problem of plan assessment: Given behavior models and current observations of the plant's (possibly faulty) behavior, what is the probability of a partially executed manufacturing plan succeeding? In this work, we propose 1) a statistical relational behavior model for a class of manufacturing scenarios and 2) a method to derive statistical bounds on plan success probabilities for each product from confidence intervals based on sampled system behaviors. Experimental results are presented for three hypothetical yet realistic manufacturing scenarios.
UR - https://www.scopus.com/pages/publications/78349244783
UR - https://www.scopus.com/inward/citedby.url?scp=78349244783&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-16111-7_30
DO - 10.1007/978-3-642-16111-7_30
M3 - Conference contribution
AN - SCOPUS:78349244783
SN - 3642161103
SN - 9783642161100
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 263
EP - 271
BT - KI 2010
T2 - 33rd Annual German Conference on Artificial Intelligence, KI 2010
Y2 - 21 September 2010 through 24 September 2010
ER -