Review of the 1st EUV Light Sources Code Comparison Workshop

John Sheil*, Oscar Versolato, Vivek Bakshi, Howard Scott

*Corresponding author for this work

Research output: Contribution to JournalReview articleAcademicpeer-review

Abstract

We review the results of the 1 (Formula presented.) Extreme Ultraviolet (EUV) Light Sources Code Comparison Workshop. The goal of this workshop was to provide a platform for specialists in EUV light source plasma modeling to benchmark and validate their numerical codes using well-defined case studies. Detailed consideration of a plethora of atomic collisional and radiative processes is required for modeling EUV light source plasmas. Eight institutions spanning four countries contributed data to the workshop. Two topics were addressed, namely (i) the atomic kinetics and radiative properties of tin plasmas under EUV-generating conditions and (ii) laser absorption in a fully ionized, one-dimensional hydrogen plasma. In this paper, we summarize the key findings of the workshop and outline plans for future iterations of the code comparison activity.

Original languageEnglish
Article number130
Pages (from-to)1-18
Number of pages18
JournalAtoms
Volume11
Issue number10
Early online date13 Oct 2023
DOIs
Publication statusPublished - Oct 2023

Bibliographical note

This article belongs to the Special Issue: Atomic Processes for Plasma Modeling Applications.

Funding Information:
The work of H. Scott was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344.

Publisher Copyright:
© 2023 by the authors.

Funding

The work of H. Scott was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344.

FundersFunder number
U.S. Department of Energy
UK Research and Innovation103507
Lawrence Livermore National LaboratoryDE-AC52-07NA27344

    Keywords

    • atomic kinetics
    • code comparison
    • EUV source plasma
    • laser absorption

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