Sensitivity of Applications to Large Differences in Bandwidth and Latency in Two-Layer Interconnects.

A. Plaat, H.E. Bal, R.F.H. Hofman, T. Kielmann

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
JournalFuture Generation Computer Systems
Publication statusPublished - 2000

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