SiON Integrated Optics Elliptic Couplers for Fizeau-Based Optical Coherence Tomography

V.D. Nguyen, N. Ismail, F. Sun, K. Wörhoff, T.G. van Leeuwen, J. Kalkman

Research output: Contribution to Journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	2836-2842
Journal	Journal of Lightwave Technology
Volume	28
Issue number	19
DOIs	https://doi.org/10.1109/JLT.2010.2066958
Publication status	Published - 2010

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title = "SiON Integrated Optics Elliptic Couplers for Fizeau-Based Optical Coherence Tomography",

author = "V.D. Nguyen and N. Ismail and F. Sun and K. W{\"o}rhoff and {van Leeuwen}, T.G. and J. Kalkman",

year = "2010",

doi = "10.1109/JLT.2010.2066958",

language = "English",

volume = "28",

pages = "2836--2842",

journal = "Journal of Lightwave Technology",

issn = "0733-8724",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "19",

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T1 - SiON Integrated Optics Elliptic Couplers for Fizeau-Based Optical Coherence Tomography

AU - Nguyen, V.D.

AU - Ismail, N.

AU - Sun, F.

AU - Wörhoff, K.

AU - van Leeuwen, T.G.

AU - Kalkman, J.

PY - 2010

Y1 - 2010

U2 - 10.1109/JLT.2010.2066958

DO - 10.1109/JLT.2010.2066958

M3 - Article

VL - 28

SP - 2836

EP - 2842

JO - Journal of Lightwave Technology

JF - Journal of Lightwave Technology

SN - 0733-8724

IS - 19

ER -