Snow albedo sensitivity to macroscopic surface roughness using a new ray tracing model

Fanny Larue*, Ghislain Picard, Laurent Arnaud, Inès Ollivier, Clément Delcourt, Maxim Lamare, François Tuzet, Jesus Revuelto, Marie Dumont

*Corresponding author for this work

Research output: Contribution to JournalArticleAcademicpeer-review

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Earth & Environmental Sciences